LIPI ALFA

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ANNOUNCEMENT

We inform external customers must apply services via ELSA (E-Layanan Sains LIPI). You can access ELSA from https://elsa.lipindonesia.com/

 

SiAlfa In a Glance

SiAlfa is a dedicated online system for applying material characterization in Laboratory P2 Fisika (LPPF) - LIPI, Indonesia. The user-friendly web-based interface will help users to get fast, qualified, certified and excellent services based on ISO/IEC 17025:2017. This laboratory is managed by Research Center for Physics, Indonesia Institute of Sciences.

New users are welcome to create a new account for services. There are four user categories as follow.

No User Category Service Procedure Payment Procedure
1 Internal P2 Fisika Users Directly at www.sialfa.fisika.lipindonesia.com Voucher. Please refer to Top Up procedure
2 IPT-LIPI Users Request letter and application at www.sialfa.fisika.lipindonesia.com Voucher. Please refer to Top Up procedure
3 LIPI Non-IPT Users Directly at www.sialfa.fisika.lipindonesia.com Billing
4 External Users Directly at www.sialfa.fisika.lipindonesia.com Billing
 
 

1. 16-Channels Battery Analyzer

Equipment          : 16-Channels Battery Analyzer

Brand / Type      : MTI CORPORATION / BST8-16-10V2A-IR

Function              :  16-channel battery analyzer used for testing all kinds of battery including Li-ion battery, NiMH, NiCd, etc. Each channel is an independent, programmable constant current (0.1-2A) and constant voltage (0-10V). Max testing steps per channel: 25. Max cycles: 2000.

2. 3D-Optical Microscope

The vhx-5000 digital microscope is able to instantly capture any area in complete focus – without the need for the user to adjust focus. The vhx-5000 is equipped with a new cmos camera, capable of imaging at 50 frames per second and able to enhance contrast and reduce over/under saturated areas on a target using a high dynamic range algorithm. This function can now be combined with a super high resolution imaging mode that uses short-wavelength light and pixel shift technology to improve resolution by up to 25% with a magnification range from 0.1x - 5000x. 

Services
No Service
1 3D Optical Microscope

3. 8-Channel Battery Analyzer

Equipment          : 8-Channel Battery Analyzer

Brand / Type      : MTI CORPORATION / BST8-10A30V

Function              : 8 –channel battery analyzing system for Li-ion, NiMH, NiCd and lead acid battery packs with up to 30V and 10A per channel. Time range: 0 – 999 seconds. Input impedance: > 10 m-ohm

4. Alumina Tube Furnac

Equipment          :  Alumina Tube Furnace

Brand / Type      : MTI CORPORATION / GSL-1700X060-III-F3LV

Function              : Three-zones tube furnace with mechanical vacuum pump. Can heat sample to 1700oC and achieve vacuum degree up to 0.05 torr.

5. Automatic Roll to Roll Battery Electrode Coating System

Equipment         : Automatic Roll to Roll Battery Electrode Coating System

Brand / Type      : MTI CORPORATION / MSK-AFA-E300

Function              : Automatic battery electrode coating system integrated with roll unwinding, slurry feeder, coating blade, baking oven, and final electrode winding. Maximum coating width 250mm, coating speed 0-750mm/minute.

6. Bench Top Planetary Automatic Ball Mill

Equipment          : Bench Top Planetary Automatic Ball Mill

Brand / Type      : MTI CORPORATION / MSK-SFM-1

Function              : Planetary ball mill for mixing, fine grinding and preparing small volume material. Minimum product granularity up to 0.1 micron.

Services
No Service
1 Ball Mill

7. BET

By BET (Brunauer, Emmett and Teller) the specific surface area of a sample is measured – including the pore size distribution. This information is used to predict the dissolution rate, as this rate is proportional to the specific surface area. Thus, the surface area can be used to predict bioavailability. Further it is useful in evaluation of product performance and manufacturing consistency.

Equipment          : BET Surface Area and Pore Size Analyzer

Brand / Type      : Quantachrome Nova 4200e

Function              : Nova 4200e can produce BET surface area as well as pore size and capable of measuring both adsorption and desorption isotherms in a few hours. Surface area range starts from 0.01 m2/g and pore size range of 0.35 to 400 nm. Can measure up to 4 samples at the same time.

Services
No Service
1 BET (Surface Area)
2 BET (Surface Area + Poresize Distribution)

8. Chemisorption

Equipment          : Chemisorption Analyzer

Brand / Type      : Micromeritics AutoChem II 2920

Function              : AutoChem II 2920 can conduct comprehensive array of highly precise studies of chemical adsorption and temperature-programmed reactions. It can determine catalyst properties such as percent of metal dispersion, active metal surface area, acid strength, surface acidity, distribution of strength of active sites, and BET surface area.

It can also perform pulse chemisorption, temperature-programmed reduction (TPR), desorption (TPD), oxidation (TPO), and reaction analyses and does it automatically. Temperature can be controlled from sub-ambient (-70oC) to 1100oC with programmable heating ramps and plateaus.

Services
No Service
1 Chemisorption

9. Coating SEM

Services
No Service
1 Coating SEM

10. Compact Hydraulic Crimping Machine

Equipment          : Compact Hydraulic Crimping Machine

Brand / Type      : MTI CORPORATION / MSK-110

Function              : Coin cell crimper for sealing various types of coin cells such as CR2032, CR2025 and CR2016 without changing the die. Pressure: max. 8 tons hydraulic pump with automatic pressure relief. Suitable for operation inside glove box.

11. Compact Vacuum Sealer

Equipment          : Compact Vacuum Sealer

Brand / Type      : MTI CORPORATION / MSK-115A

Function              : Compact vacuum sealer for sealing aluminum-laminated case in glove box after injection of electrolyte into pouch cell. Adjustable sealing pressure, sealing temperature and heating timer.

12. Cyclic Voltametry

Cyclic Voltammetry (CV) is an electrochemical technique which measures the current that develops in an electrochemical cell under conditions where voltage is in excess of that predicted by the  Nernst equation. CV is performed by cycling the potential of a working electrode, and measuring the resulting current.

Services
No Service
1 Uji Cyclic Voltametry

13. Desktop Ultrasonic Metal Welder

Equipment          : Desktop Ultrasonic Metal Welder

Brand / Type      : MTI CORPORATION / MSK-800

Function              : Ultrasonic metal welder designed for welding stacked electrode sheets (copper and aluminum) and tab onto current collectors (from 2 to 25 layers) to prepare Li-ion pouch cells.

14. EIS - ZIVE 5

ZIVE SP5 Potentiostat + EIS 1MHz (Compliance: ±10V - Max. Current: ±5A, 1.5 fA)

The best choice for the complete DC and impedance characterization of various energy sources and storage such as fuel cell, battery, solar cell, supercapacitor, etc. Also, its versatile functions make it suited to other applications including corrosion, coatings, sensors and other fundamental electrochemical analysis. The system is designed under FPGA and DSP control with high-speed capability.
DAC Control: Two sets of high-speed 16bit DAC(50MHz) for offset & scanning & one set of 16bit DAC(1MHz) for auxiliary analog output control
ADC Reading: Two sets of 16 bit 500kHz ADC for reading voltage/current and 4 channel 16bit 250kHz ADCs for auxiliary data input such as temperature, auxiliary voltage, etc. It provides high-frequency EIS, fast pulse techniques and high-speed sampling time.

Services
No Service
1 Uji Electrochemical Impedance Spectroscopy - ZIVE5

15. Electric Vacuum Mixer with Helical Blade

Equipment          : Electric Vacuum Mixer with Helical Blade

Brand / Type              : MTI CORPORATION / MSK-SFM-6E

Function              : Electric vacuum mixer (5L capacity with cold water stainless steel tank. Programmable in speed, time, and rotational direction.

16. FE-SEM

JIB-4610F is an easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section. 

Services
No Service
1 Field Emission -Scanning Electron Microscope
2 FE-SEM+EDS (Mapping)
3 FE-SEM+EDS (Point/Line)

17. Focus Ion Beam

Equipment  : Multi Detector of Foccused Ion Beam (FIB)

Brand         : JEOL JIB 4610F

Function     : The JIB-4610F system incorporates an easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun and a new FIB column capable of large milling currents (90 nA) into a single chamber.

After high-speed processing of the cross-section using FIB, it is possible to perform high-speed analysis using any of the various analysis units like CLD (cathodoluminescence), EBSD (crystal orientation analysis system) and EDS (energy dispersive X-ray spectrometry), making use of the high-resolution SEM imaging and the Schottky electron gun capable of providing large currents (200 nA).

The standard configuration includes a 3D analysis function, where milling of cross sections is performed automatically at fixed intervals, with SEM images acquired for each cross section (Cut&See). By also utilizing the optional 3D reconstruction software, it is possible to make even more detailed analyses of the 3 dimensional structures of a complex sample.

Main Features

  1. High-precision processing and high-resolution imaging delivered by a combination of an FIB column and a high-resolution SEM equipped with a Schottky electron gun.
  2. It is possible to observe a cross section with high-resolution SEM (resolution of 1.2 nm at 30 kV, and 3.0 nm at 1 kV) after using FIB to perform milling of the cross section with high positioning precision. It is also possible to fabricate even more precise thin-film specimens for transmission electron microscope (TEM).
  3. High-speed milling of large areas achieved with the FIB column having a maximum ion current of 90 nA
  4. The use of a new, large-current FIB column (maximum 90 nA) enables even faster processing. (Milling speeds of more than 2 times faster than conventional devices (in-house comparison)). This is especially useful for large surface areas.
  5. High-speed and high-resolution analysis such as EDS and EBSD possible with the electron gun capable of a maximum current of 200 nA
  6. The SEM column with a maximum current of 200 nA provides high-speed, high-resolution analysis capability. SEM imaging and analysis can be performed after FIB milling of the surface of the observed area, without moving the stage.
  7. 3D imaging, 3D analysis
  8. By combining various analysis units with the high-speed, large-current FIB and the high-resolution SEM equipped with the Schottky gun enables

Automatic continuous milling and imaging of SEM images using Cut & See

Automatic continuous data acquisition for EDS and EBSD mapping

  • By stacking the sequentially acquired images, imaging and analysis can be rendered in 3D. In addition, for any type of analysis, the data can be acquired without any tilting, rotation or translation of the stage.
  • Cooling stage application for non conductive samples in life sciences, polymer, and many others applications.
Services
No Service
1 Focused Ion Beam (FIB ) Sampel Paduan Logam (Alloy)
2 Focused Ion Beam (FIB ) Sampel Keramik
3 Focused Ion Beam

18. Fourier-Transform Infrared Spectrometer

Equipment : Fourier-Transform Infrared Spectrometer (FTIR)

Brand/Type : Thermoscientific Nicolet iS-10

Function : FTIR Spectrophotometer with complete infrared spectroscopy system for routine analytical needs. Easy access, rechargeable desiccants, and integrated humidity indicator. 

Performance validation system using integrated validation wheel with NG-11 and NIST traceable polystyrne film standard and System Performance Verification (SPV) software and programmable tasks interface.

Wave number range: 400 – 7,500

Services
No Service
1 FTIR

19. Function Generator

Equipment          : Function Generator

Brand / Type      : Trio AG-203 CR Oscillator

Function              : Frequency dial scale calibrated with single-scale graduations for frequency range 10Hz to 1MHz selectable in 5 ranges. High output design; more than 7V rms at no load and more than 3.5V rms at 600Ω. Output level is fully adjustable with a 10dB step, 6 range attenuator and a level indicator.

Low output impedance of 600 Ω. The attenuator provides accuracy of ±1dB at 600 Ω load. Sine and Square waves easily available. Synchronizing input terminal. Extremely high stability against variation of power source.

20. Impedance Analyzer

The Zurich Instruments MFIA is a digital impedance analyzer and precision LCR meter that sets the new standard for impedance measurements in the frequency range from 1 mHz to 5 MHz. The MFIA has a basic accuracy of 0.05% and operates over a measurement range spanning from 1 mΩ to 1 TΩ. It is also characterized by high measurement repeatability and small temperature drift. 

Services
No Service
1 Impedance Analyzer -Zurich Instrument

21. Konduktivitas Listrik

Services
No Service
1 Uji Konduktivitas Listrik

22. Large Bench-Top High Temperature Muffle Furnace

Equipment         : Large Bench-Top High Temperature Muffle Furnace

Brand / Type      : MTI CORPORATION / KSL-1700X-A2

Function              : High temperature muffle furnace with max. working temperature of 1700oC. Heating rate up to 20oC/min. Chamber size 8”x8”x8”.

23. Mikroskop Polarisasi

Need Description

Services
No Service
1 Mikroskop Polarisasi

24. Mini Plasma Sputtering Coater

Equipment          : Mini Plasma Sputtering Coater

Brand / Type      : MTI CORPORATION / GSL-1100X-SPC12

Function          :  Plasma sputtering coater for making metallic coatings (e.g gold, platinum, iridium, silver , etc) which can be applied on a sample up to 40 mm diameter with 300 Angstrom inches.

25. Nail Penetration Tester

Equipment          : Nail Penetration Tester

Brand / Type      : MTI CORPORATION / MSK-TE9002

Function              :  Nail penetration tester for all types of rechargeable battery. Penetration process is carried in a safe and vented stainless chamber using 2-8 mm diameter steel nail at variable speed from 10 – 40 mm/s. Penetration force: 0-500 kg. Impact energy: 5J max.

26. Nd-YAG Laser for material fabrication

NdYAG Laser is available for services:

1. Laser induced breakdown spectroscopy

2. Laser ablation for nanoparticles fabrication such as Au, Ag, ZnO, MoS2, TiO2 etc

Services
No Service
1 Uji Nd -YAG Laser untuk Fabrikasi bahan

27. NI-PXI (rugged PC-based platform for measurement and automation systems)

Equipment         : NI-PXI (rugged PC-based platform for measurement and automation systems)

Brand / Type      : National Instruments, NI PXIe-1085 and NI PXIe-1082

Function              : LabVIEW included. 16-bit, 250 kS/s, 16 AI, 24 VDC Multifunction DAQ. ± 20V, 2A, isolated output programmable power supply (SMU). 40 MHz Arbitrary Function Generator. 64-channel ecternal relay driver module and high-current general purpose relay switch. 7½-digit PXI Digital Multimeter (DMM) and 1000 V Digitizer

28. Optical Spectrum Analyzers

Equipment          : Optical Spectrum Analyzers (OSA)

Brand / Type      : Yokogawa AQ6370C

Function              : The Yokogawa AQ6370C has the ability to provide high speed, accurate analysis of the wavelength range between 600 nm and 1700 nm. Wavelength accuracy: ± 0.02 nm. Wavelength resolution: 0.02 o 2 nm. Level sensitivity: -90 dBm. Dynamic range: ≥ 73 dB. 

It can measure high power sources such as optical amplifiers and pump lasers for Raman amplifier and very weak optical signals as well. Measurement sensitivity can be chosen from seven categories according to test applications and measurement speed requirements.

29. Optical Time Domain Reflector

Equipment         : Optical Time Domain Reflector (OTDR)

Brand / Type      : Anritsu / Access Master MT9083

Function          : The MT9083 Access Master test sets are designed to make your measurement experience simple and error-free with true one-button fault location, pass/fail classification, automated file saving and naming and even a macrobend detection feature for identifying installation issues. New fiber visualizer feature offering easy graphical summary & PDF reporting. Automated connector PASS/FAIL based on IEC 61300-3-35.

30. Precise Pneumatic Point Welding Machine

Equipment          : Precise Pneumatic Point Welding Machine

Brand / Type      : MTI CORPORATION / MSK-330A

Function              : Welding the Li-Ion battery cylinder core negative terminal to the bottom of the cylinder case. Welding thickness of 0.03 – 0.25 mm.

31. PSA Mikro

Equipment          : Particle Size Analyzer (PSA) Cilas

Brand / Type      : Cilas 1190

Function            :

  • Particle characterization with integrated wet and dry dispersion modes, built in video camera and short optical path.
  • Cilas 1190 provides a measurement range from 0.04 to 2,500 μm while maintaining an extremely small footprint.
  • The integration of a CCD camera allows the CILAS 1190 to gather particle shape information along with the traditional particla size distribution data.
Services
No Service
1 PSA Mikro

32. PSA-N

Equipment          : Particle Size Analyzer (PSA) Nanoplus

Brand / Type      : Nanoplus Particulate Systems

Function         : Highly accurate zeta potential measurements of  concentrated solutions within a wide concentration range of 0.00001 to 40% (w/v). The Nanoplus has a dynamic sizing range of 0.1 nm to 12.30 μm in a concentration range of up to 40% w/v, and a sensitivity for molecular weight to as low as 250 Da. Dual correlators, log-scale for larger particles prone to time decay and linear scale for small particles, provide high sensitivity measurements in multicomponent samples.

 

 

Services
No Service
1 PSA Nano

33. Raman

Specification:

Instrumen Type : Modular Raman

Spectro : Type iHR320

Grafting : 600 g/mm (500 nm); 1200 g/mm (750 nm); 1800 g/mm (450-850 nm)

Objektive: 5X, 10 X dan 100X

Laser : 532 nm and 785 nm

                              

Function:

Raman Spectroscopy is an instrument which measure molecular vibration based on inelastic scattering phenomenon. Raman spectroscopy is a non-destructive chemical analysis characterization which provides detail information about identification of molecules, molecular analysis, phase and polymorphy, crystallinity, molecular interactions, analysis of carbon-based materials, and analysis of inorganic materials. Raman analysis can provide key information (qualitative or quantitative) easily and quickly. Our Raman spectroscopy can measure bulk, powder, thin film or liquid samples. Applications of Raman spectroscopy: Carbon materials (carbon nanotube, graphene, carbon-based materials), pharmaceuticals and cosmetics (example compound distribution, drugs, contaminant identification), life sciences (example DNA/RNA analysis), geology and mineralogy (example gemstone and mineral identification).

Services
No Service
1 Raman-Horiba

34. Resistivitas Listrik

Services
No Service
1 Uji Resistivitas Listrik

35. Scanning Electron Microscope

Equipment : Scanning Electron Microscope (SEM)

Brand/Type : Hitachi SU-3500

Function : SU3500 Scanning Electron Microscope features innovative electron optics and signal detection systems affording unparalleled imaging and analytical performance. All new electron optics design with best-in-class image sharpness.

Wide screen GUI and fast auto image optimization functions (7 seconds) via “delegation” technology. Ultra Variable-Pressure Detector: image surface information at low vacuum and low accelerating voltages. Stereoscopic image function: point and click for seamless, real-time 3D image observation.

Services
No Service
1 Scanning Electron Microscope
2 Scanning Electron Microscope (SEM) dan EDS (Point/Mapping)
3 Scanning Electron Microscope (SEM) dan EDS (Point+Mapping)

36. Semi-Automatic Winding Machine for Electrodes

Equipment          : Semi-Automatic Winding Machine for Electrodes

Brand / Type      : MTI CORPORATION / MSK-112A

Function              : Semi-automatic winder for windine electrodes with separator together for Li-ion batteries.

37. Short Circuit Test Chamber

Equipment          : Short Circuit Test Chamber

Brand / Type      : MTI CORPORATION / MSK-TE1000A

Function              : Short circuit test chamber for testing rechargeable batteries and packs under a large current draw up to 1000A. This test system consists of two units: power control unit with high current switch and explosion proof chamber. A remote control is included to allow the user to safely perform the short circuit test up to 7 meters away.

38. Sliding Tube Furnace

Equipment          : Sliding Tube Furnace

Brand / Type      : MTI CORPORATION / GSL-1500X-OTF-80SL

Function              : Slideable tube furnace with max. working temperature of 1500oC. Heating rate up to 100oC/min or 50oC/sec under vacuum or inert gases.

Sample                 : Solid

39. Spark Plasma Sintering

Suhu Sintering  hingga 2500oC

Heating rate hingga 500oC/menit

Compresive pressure 10 ton

Rotary pump < 6 Ton

Diffusiion pump :  10-3  Pascal

40. STA-TGA-DSC

Berfungsi sebagai Thermogravimetry (TG) dan Differential Scanning Calorimetry (DSC) simultan (non paralel) dengan kemampuan high vacuum dan stabilitas TG Drift. Rentang suhu -150 oC sampai 1300 oC. Level vakum sampai 10-5 mbar dan resolusi sampai 0.025 µg.

Services
No Service
1 Uji TGA (TGA -DSC )

41. Thermal Conductivity Analyzer

Equipment: Thermal conductivity analyzer

Brand/Type: C-Therm / TCi

Function: C-Therm TCi thermal conductivity analyzer berguna untuk mengukur nilai konduktivitas termal pada rentang 0 -100 W/m.K. Sampel material uji dapat berupa, padatan, cairan, serbuk dan pasta.  Alat ini dapat mengukur konduktivitas termal pada rentang -50 oC - 200 oC jika dilengkapi dengan thermal chamber. Namun hanya dapat mengukur pada kondisi temperatur kamar jika tidak menggunakan thermal chamber. Metode pengukuran yang digunakan  berupa Modified Transient Plane Source (MTPS)  - ASTM D7984.

42. Transmission Electron Microscope

Equipment           : Transmission Electron Microscope (TEM)

Brand / Type       : Tecnai G2 20S-Twin

Function              :  Transmission Electron Microscope is a microscopy technique where electron beam is transmitted through a very thin speciment (thickness  £ 100 nm), and the interactive result is enlarged in the form of an image and displayed with a CCD camera, fluorescence screen, or film sheet.

TEM FEI Tecnai G2 20S-Twin is a 200kV voltage acceleration class TEM with sub Ångström resolution of 0.24 nm (point) and 0.188 nm (line), magnification range of 25x – 1030kx which is equipped with CCD Camera and EDS (Energy Dispersive X-Ray Spectroscopy) facility. With above specification, TEM FEI Tecnai G2 20S-Twin is able to analyze material and biological sample particularly for failure/defects analysis, material phase determination, elemen composition and another imaging purposes with nanometer resolution. Some of the unique feature of this equipment is that it can also be used as STEM, correlative microscopy, observation under cryogenic condition and tomography of 3D macromolecule structure.

43. Tunable Laser

Equipment          : Tunable Laser

Brand / Type      : Santec / TSL-510

Function              : Using real-time referencing, while simultaneously acquiring output power from TSL-510 and the transmitted optical power through the DUT, provides high accuracy in WDL/PDL analysis. Real-time power reference: accurate WDL/PDL characteristics measurements (high power repeatability ±0.02dB), automatic normalization of laser source power, no need of additional power meter for WDL reference. Rescaling algorithm utilized in sweep processing (data acquisition unit). Simultaneous multi-channel measurement. Shared library support (DLL file): convenient set up of measurement parameters and data analysis.

44. Uji Charge/Discharge

Services
No Service
1 Uji Charge/Discharge

45. Uji Kuat Magnet (magnetisasi)

The magnetic field strength meter FH 55 is a compact precision instrument that measures the magnetic flux density (induction) B and the magnetic field strength H in Gauss, Tesla or Ampere/Meter.

The specification of this instrument are below:

  • 3 ¾ - digit LC display (0...+/- 2999)
  • Ranges* :
    30 µT, 300 µT, 3 mT, 30 mT, 300 mT, 3 T, 30 T
    300 mG, 3 G, 30 G, 300 G, 3 kG, 30 kG, 300 kG
    24 A/m, 240 A/m, 2.4 kA/m, 24 kA/m, 240 kA/m, 2.4 MA/m, 24 MA/m
    *ranges available depend on probe type
  • Frequency: DC, 30 Hz – 20 kHz (limits depend on probe type)
  • Basic accuracy (without probe):
    DC : ± 0.3 %
    AC : ± 2 %
Services
No Service
1 Uji Kuat Magnet

46. Uji Picosecond Laser TC SPC untuk Pengujian

Picosecond laser is available for measurements:
1. Photoluminescence
2. Time-resolved Photoluminescence

Services
No Service
1 Uji Picosecond Laser TC SPC untuk Pengujian

47. Uji Stack Performance PEMFC Single Cell

Features:

  • for 100Watt PEM & DMFC single cell
  • fully integrated compact size
  • automatic purge gas control
  • temperature measurement and control external anode & cathode line and cell
  • various safety functions
  • fully automatic operation by PC control
  • max. 4 channel controllable with a PC
  • accurate electronic load for fuel cell application
  • stoichiometric control is available
  • piston pump for methanol flow control
  • NafionTM membrane type humidifiers for fuel and oxidant gas
  • powerful software with independent data analysis software
Services
No Service
1 Uji Stack Performance PEMFC Single Cell

48. UV-VIS

Equipment        : UV-Vis Spectrophotometer

Brand / Type     : Hitachi / UH5300

Function            : UH-5300 can be used to analyse chemical and biological samples in liquid form both qualitatively as well as quantitatively. It can also measure transmittance and absorbance of samples in the form of thin film and glass filter by using appropriate sample holder.

 

Feature:

- Use of long-life xenon flash lamp : Light source is guaranteed for seven years resulting in lower operation cost

- Automatic 6-cell turret as standard equipment: Improved efficiency and increased sample throughput (especially for quantitative analysis).

Services
No Service
1 UV-Vis Hitachi

49. Vaccum Furnace

Three-zones tube furnace with mechanical vacuum pump. Can heat sample to 1700oC and achieve vacuum degree up to 0.05 torr.

50. Vicker Hardness

Need Description

Services
No Service
1 Uji Kekerasan

51. VSM

Peralatan ini dapat digunakan untuk mengukur sifat-sifat magnetik pada bahan magnetik. Beberapa output yang dapat dihasilkan melalui pengukuran dengan VSM250 adalah kurva hysteresis (M-H loop), kurva magnetisasi (M-H curve), dan kurva pemanasan (M-T curve). Berdasarkan beberapa metode pengukuran tersebut, dapat dihasilkan karakteristik magnetic bahan seperti momen magnetic saturasi (Ms), momen magnetic remanen (Mr), koersivitas magnetic intrinsic (Hci), energi produk maksimum (BHmax) dan Temperature Curie(Tc). Material yang dapat dianalisis menggunakan VSM250 antara lain dapat berbentuk serbuk, bongkah/serpihan maupun film tipis. Variasi suhu (T) yang dapat divariasikan menggunakan VSM250 di Pusat Penelitian Fisika LIPI adalah pada rentang T = 25 – 500 °C (298 – 773 K). Medan magnetik eksternal dari VSM250 memiliki rentang
penggunaan dari H = 100 Oe – 21 kOe.

Services
No Service
1 Vibrating Sample Magnetometer

52. X-ray diffraction

Our XRD instrument, the Rigaku SmartLab is a highly flexible general-purpose X-ray diffractometer system. It includes optics for both standard Bragg-Brentano (BB) and parallel-beam (PB) optics for use with, powders, bulk materials, thin films, and nano-materials. Primarily, our XRD is used for phase identification and phase analysis of crystalline materials, in the form of powder and bulk samples. With the new D/teX Ultra 250 1D silicon strip X-ray detector, our XRD is capable of conducting measurement with high-intensity, high-resolution, and a high peak/background (P/B) ratio. With a high-speed part focusing geometry measurement using the D/teX Ultra 250, the instrument is also able to detect trace components of a few % or less whose diffraction intensity is faint. In addition, in the near future, our XRD can support residual stress measurement and pole figure measurement to observe the orientation distribution of crystallographic lattice planes in crystallography and texture analysis, using αβ attachment, PDXL stress analysis, and 3D explore PF software.

Services
No Service
1 X-Ray Diffraction
2 Analisa X-Ray Diffraction

53. X-Ray Fluorescence

Equipment          : X-Ray Fluorescence (XRF) Spectroscopy

Brand / Type       : Torontech EDXpert Portable XRF Analyzer

Function          : Portable XRF Analyzer operates at a high voltage of 40 kV (can be set for up to 50 kV), and has a detectable range of Cl to U. The light element option has a detectable range from Mg to U. EDXpert Portable XRF Analyzer is controlled by a Hewlett-Packard iPAQ PDA that provides high flexibility and usability of the Analyzer’s system. Detector type: solid state Si-pin-diode with thermo-electrical cooling. Energy resolution: 165 eV at 5.9 keV.

Services
No Service
1 XRF Portabel

54. Zeta Potensial

Highly accurate zeta potential measurements of  concentrated solutions within a wide concentration range of 0.00001 to 40% (w/v). The Nanoplus has a dynamic sizing range of 0.1 nm to 12.30 μm in a concentration range of up to 40% w/v, and a sensitivity for molecular weight to as low as 250 Da. Dual correlators, log-scale for larger particles prone to time decay and linear scale for small particles, provide high sensitivity measurements in multicomponent samples.

Services
No Service
1 Uji Potensial Zeta (Zeta Potential)
Service Price Note
16-Channels Battery Analyzer
3D-Optical Microscope
3D Optical Microscope Khusus Internal Fisika Rp. 0 PP No. 32 Tahun 2016
Instansi Pemerintah Rp. 50,000
Umum/Industri Rp. 50,000
Diploma Rp. 50,000
S1 Rp. 50,000
S2 Rp. 50,000
S3 Rp. 50,000
8-Channel Battery Analyzer
Alumina Tube Furnac
Automatic Roll to Roll Battery Electrode Coating System
Bench Top Planetary Automatic Ball Mill
Ball Mill Instansi Pemerintah Rp. 50,000 PP No. 32 Tahun 2016
Umum/Industri (per jam) Rp. 100,000
Diploma (per jam) Rp. 25,000
S1 (per jam) Rp. 25,000
S2 (per jam) Rp. 50,000
S3 (per jam) Rp. 50,000
BET
BET (Surface Area) Instansi Pemerintah Rp. 700,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 1,000,000
Diploma Rp. 500,000
S1 Rp. 500,000
S2 Rp. 700,000
BET (Surface Area + Poresize Distribution) Instansi Pemerintah Rp. 1,000,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 1,500,000
Diploma Rp. 750,000
S1 Rp. 750,000
S2 Rp. 1,000,000
S3 Rp. 1,000,000
Chemisorption
Chemisorption Instansi Pemerintah Rp. 1,000,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 1,500,000
S1 Rp. 750,000
S2 Rp. 1,000,000
S3 Rp. 1,000,000
Coating SEM
Coating SEM Instansi Pemerintah Rp. 500,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 800,000
Diploma Rp. 400,000
S1 Rp. 400,000
S2 Rp. 500,000
S3 Rp. 500,000
Compact Hydraulic Crimping Machine
Compact Vacuum Sealer
Cyclic Voltametry
Uji Cyclic Voltametry Instansi Pemerintah Rp. 75,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 150,000
S1 Rp. 50,000
S2 Rp. 75,000
S3 Rp. 75,000
Desktop Ultrasonic Metal Welder
EIS - ZIVE 5
Uji Electrochemical Impedance Spectroscopy - ZIVE5 Instansi Pemerintah Rp. 800,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 1,200,000
S1 Rp. 600,000
S2 Rp. 700,000
S3 Rp. 700,000
Electric Vacuum Mixer with Helical Blade
FE-SEM
Field Emission -Scanning Electron Microscope FE -SEM Rp. 600,000 PP No. 32 Tahun 2016
Focus Ion Beam
Focused Ion Beam (FIB ) Sampel Paduan Logam (Alloy) FIB (Preparasi Sampel TEM) Rp. 6,500,000 PP No. 32 Tahun 2016
FIB + EDS Rp. 6,700,000
FIB + EDS + TEM Rp. 8,000,000
Focused Ion Beam (FIB ) Sampel Keramik FIB (Preparasi Sampel TEM) Rp. 8,000,000 PP No. 32 Tahun 2016
FIB + EDS Rp. 8,200,000
FIB + EDS + TEM Rp. 9,500,000
Focused Ion Beam FIB + EDS + TEM (per jam) Rp. 1,000,000 PP No. 32 Tahun 2016
2D FIB + EDS + EBSD (Bukan Preparasi Sampel TEM) Rp. 3,250,000
FIB + EDS + TEM + EDS Rp. 10,000,000
Fourier-Transform Infrared Spectrometer
FTIR Instansi Pemerintah Rp. 500,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 1,000,000
Diploma Rp. 250,000
S1 Rp. 250,000
S2 Rp. 500,000
S3 Rp. 500,000
Function Generator
Impedance Analyzer
Impedance Analyzer -Zurich Instrument Instansi Pemerintah Rp. 1,800,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 2,500,000
S1 Rp. 1,000,000
S2 Rp. 1,500,000
S3 Rp. 1,500,000
Konduktivitas Listrik
Uji Konduktivitas Listrik Instansi Pemerintah Rp. 550,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 700,000
S1 Rp. 400,000
S2 Rp. 550,000
S3 Rp. 550,000
Konstanta Dielektrik
Large Bench-Top High Temperature Muffle Furnace
Mikroskop Polarisasi
Mikroskop Polarisasi Instansi Pemerintah Rp. 150,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 250,000
S1 Rp. 125,000
S2 Rp. 150,000
S3 Rp. 150,000
Mini Plasma Sputtering Coater
Nail Penetration Tester
Nd-YAG Laser for material fabrication
Uji Nd -YAG Laser untuk Fabrikasi bahan Instansi Pemerintah Rp. 250,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 350,000
S1 Rp. 200,000
S2 Rp. 250,000
S3 Rp. 250,000
NI-PXI (rugged PC-based platform for measurement and automation systems)
Optical Spectrum Analyzers
Optical Time Domain Reflector
Precise Pneumatic Point Welding Machine
PSA Mikro
PSA Mikro Instansi Pemerintah Rp. 400,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 600,000
Diploma Rp. 250,000
S1 Rp. 250,000
S2 Rp. 400,000
S3 Rp. 400,000
PSA-N
PSA Nano Instansi Pemerintah Rp. 750,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 1,000,000
Diploma Rp. 400,000
S1 Rp. 400,000
S2 Rp. 750,000
S3 Rp. 750,000
Raman
Raman-Horiba Solid Sampel Rp. 400,000 PP No. 32 Tahun 2016
Liquid with Cuvet Rp. 500,000
Liquid without Cuvet Rp. 800,000
Solid Sampel Rp. 400,000
Liquid with Cuvet Rp. 500,000
Liquid without Cuvet Rp. 800,000
Solid Sampel Rp. 400,000
Liquid with Cuvet Rp. 500,000
Liquid without Cuvet Rp. 800,000
Solid Sampel Rp. 400,000
Liquid with Cuvet Rp. 500,000
Liquid without Cuvet Rp. 800,000
Solid Sampel Rp. 400,000
Liquid with Cuvet Rp. 500,000
Liquid without Cuvet Rp. 800,000
Solid Sampel Rp. 400,000
Liquid with Cuvet Rp. 500,000
Liquid without Cuvet Rp. 800,000
Resistivitas Listrik
Uji Resistivitas Listrik Instansi Pemerintah Rp. 550,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 700,000
S1 Rp. 400,000
S2 Rp. 550,000
S3 Rp. 550,000
Scanning Electron Microscope
Scanning Electron Microscope Instansi Pemerintah Rp. 400,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 500,000
Diploma Rp. 300,000
S1 Rp. 300,000
S2 Rp. 400,000
S3 Rp. 400,000
Scanning Electron Microscope (SEM) dan EDS (Point/Mapping) Instansi Pemerintah Rp. 700,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 900,000
S1 Rp. 400,000
S2 Rp. 700,000
S3 Rp. 700,000
Scanning Electron Microscope (SEM) dan EDS (Point+Mapping) Instansi Pemerintah Rp. 1,000,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 1,300,000
Diploma Rp. 500,000
S1 Rp. 500,000
S2 Rp. 1,000,000
S3 Rp. 1,000,000
Semi-Automatic Winding Machine for Electrodes
Short Circuit Test Chamber
Sliding Tube Furnace
Spark Plasma Sintering
STA-TGA-DSC
Uji TGA (TGA -DSC ) Instansi Pemerintah Rp. 600,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 750,000
S1 Rp. 450,000
S2 Rp. 600,000
S3 Rp. 600,000
Thermal Conductivity Analyzer
Transmission Electron Microscope
Tunable Laser
Uji Charge/Discharge
Uji Charge/Discharge Instansi Pemerintah Rp. 400,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 500,000
S1 Rp. 300,000
S2 Rp. 400,000
S3 Rp. 400,000
Uji Kuat Magnet (magnetisasi)
Uji Kuat Magnet Instansi Pemerintah Rp. 200,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 500,000
S1 Rp. 100,000
S2 Rp. 200,000
S3 Rp. 200,000
Uji Picosecond Laser TC SPC untuk Pengujian
Uji Picosecond Laser TC SPC untuk Pengujian Instansi Pemerintah Rp. 250,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 350,000
S1 Rp. 200,000
S2 Rp. 200,000
S3 Rp. 200,000
Uji Stack Performance PEMFC Single Cell
Uji Stack Performance PEMFC Single Cell Instansi Pemerintah Rp. 2,500,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 3,000,000
S1 Rp. 1,500,000
S2 Rp. 2,000,000
S3 Rp. 2,000,000
UV-VIS
UV-Vis Hitachi Instansi Pemerintah Rp. 100,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 100,000
Diploma Rp. 100,000
S1 Rp. 100,000
S2 Rp. 100,000
S3 Rp. 100,000
Vaccum Furnace
Vicker Hardness
Uji Kekerasan Instansi Pemerintah Rp. 350,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 500,000
Diploma Rp. 250,000
S1 Rp. 250,000
S2 Rp. 350,000
VSM
Vibrating Sample Magnetometer Instansi Pemerintah Rp. 700,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 900,000
Diploma Rp. 350,000
S1 Rp. 350,000
S2 Rp. 700,000
S3 Rp. 700,000
X-ray diffraction
X-Ray Diffraction Instansi Pemerintah Rp. 400,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 500,000
S1 Rp. 300,000
S2 Rp. 400,000
S3 Rp. 400,000
Analisa X-Ray Diffraction Instansi Pemerintah Rp. 405,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 550,000
S1 Rp. 375,000
S2 Rp. 405,000
S3 Rp. 405,000
X-Ray Fluorescence
XRF Portabel Instansi Pemerintah Rp. 400,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 400,000
Umum/Industri (SEWA) per hari Rp. 6,000,000
Diploma Rp. 300,000
S1 Rp. 300,000
S2 Rp. 400,000
S3 Rp. 400,000
Zeta Potensial
Uji Potensial Zeta (Zeta Potential) Instansi Pemerintah Rp. 850,000 PP No. 32 Tahun 2016
Umum/Industri Rp. 1,100,000
S1 Rp. 500,000
S2 Rp. 850,000
S3 Rp. 850,000

Top Up Scheme

Top Up scheme is only applied for internal users only (internal P2 Fisika and LIPI-IPT Users). Internal users are able to use his/her voucher for applying characterizations. All information regarding Top Up is only available in Indonesian language.

Persyaratan Top Up

  1. Top Up dilakukan dengan menggunakan output 1 (satu) tahun sebelumnya. Pada pengajuan 2019, KTI/dokumen yang diterima adalah output 1 Jan 2018 - 31 Des 2018).
  2. Syarat KTI/dokumen yang diajukan sebagai berikut:
    1. Internal P2 Fisika: Minimal satu gambar/kurva/hasil pengujian dari alat layanan P2 FISIKA-LIPI (list terlampir).
    2. Eksternal P2 Fisika:
      1. Minimal satu gambar/kurva/hasil pengujian dari alat layanan P2 FISIKA-LIPI (list terlampir);
      2. Ucapan terima kasih / acknowledgment kepada P2 FISIKA-LIPI atau nama kegiatan penelitian yang menggunakan layanan voucher  di akhir KTI/dokumen (jika tidak ada afiliasi penulis dari P2 Fisika - LIPI).
      3. Mencantumkan salah satu nama peneliti di P2Fisika.
  3. Dokumen pendukung top up harus sudah tersimpan dalam Kegiatan-Ku dan Publikasi-Ku dengan data dukung bukti yang cukup. Dokumen yang tidak tersimpan di Kegiatan-Ku dan Publikasi-Ku atau dokumen yang tidak punya bukti dukung tidak akan dinilai dalam top up.
  4. Pengajuan Top Up dapat dilakukan kapan saja sepanjang tahun dengan mengikuti seluruh prosedur yang ditetapkan.
  5. Penilaian Top Up akan didasarkan pada ketentuan yang berlaku pada Juknis Fungsional Peneliti Satu point dalam juknis dinilai seharga Rp. 500.000.

Prosedur Top Up

  1. Pemohon mendownload form permohonan Top Up yang tersedia di website www.siAlfa.id dan mengupload kembali untuk pengajuan top up disertai dengan
    1. Daftar KTI/dokumen yang diusulkan
    2. Link DOI / lampiran Softcopy full paper
    3. KTI / dokumen yang tidak bisa di akses oleh tim penilai voucher akan digugurkan (tidak dinilai)
  2. Dokumen pendukung (bukti softcopy KTI, HKI, Bimbingan Mahasiswa) pada poin 1 harus dikirimkan melalui email voucherfisika@mail.lipindonesia.com
  3. Tim layanan pengujian (dibantu oleh tim penilai voucher) akan menilai usulan Top Up. Untuk kemudian menentukan nilai voucher  yang diberikan ke masing-masing pengusul.
  4. Hasil keputusan tim penilai  voucher  diberikan berdasarkan daftar nilai KTI/Dokumen yang ditetapkan dan selanjutnya akan ditambahkan ke dalam akun voucher layanan dan terekam dalam sistem aplikasi “sialfa”.
  5. Keputusan akan nilai verifikasi top up ini bersifat mutlak dan tidak dapat diganggu gugat.

Daftar Dokumen Sebagai Bahan Top Up

Daftar Dokumen sebagai Bahan Top Up dapat didownload pada link berikut.

Untuk dokumen no 1 s.d. 4 harus menyertakan Surat Keterangan Kontributor. Jika tanpa surat keterangan kontributor, maka semua penulis/author akan dianggap sebagai kontributor biasa. Contoh surat keterangan kontributor adalah dapat didownload pada link berikut.

Contoh Form Surat Keterangan Kontributor danpat didownload pada link berikut.

Laboratorium Pusat Penelitian Fisika (LPPF)

Laboratory of Research Center for Physics

Address: Building 440-442, Kawasan Puspiptek, Setu, Tangerang Selatan, Banten 15314 Indonesia

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